Tagging of alpha particles with a large scale, high timing resolution beam profile monitor
نویسندگان
چکیده
A prototype of a new beam profile monitor with tracking and TOF capabilities for degraded beams at HISPEC/DESPEC at FAIR has been built at the Institute of Nuclear Physics at the University of Cologne [1]. The device constists of two detectors in series, each with an active area of 80x100mm. The working principle is based on secondary electrons being created by the ions passing through a thin sheet of material ( 140− 180μg/cm ) . Afterwards the electrons are accelerated and deflected out of the projected ion beam path by an electrostatic topassembly [2]. The final sub-assembled electron-detector consists of a chevron MCP-stack giving a fast timing signal and a position-sensitive dual delay line [3] (see figure 1).
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